1. Lock-in thermography
پدیدآورنده : O. Breitenstein, W. Warta, M. Langenkamp
کتابخانه: Central Library and Information Center of Shahed University (Tehran)
موضوع : Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography
رده :
TK
،
7870
.
25
،.
B74
،
2010
